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Applied material ame-500 ellipsometer amat
Applied Material AME-500 Ellipsometer
Manufacture: Applied Materials
General Description:An ellipsometer enables to measure the refractive index and the thickness of semi-transparent thin films. The instrument relies on the fact that the reflection at a dielectric interface depends on the polarization of the light while the transmission of light through a transparent layer changes the phase of the incoming wave depending on the refractive index of the material. An ellipsometer can be used to measure layers as thin as 1 nm up to layers which are several microns thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces
