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> Amray 1860 fe scanning electron microscope sem eds
Amray 1860 fe scanning electron microscope sem eds
Amray 1860 FE Scanning Electron Microscope SEM EDS
Amray 1860 FE-SEM w/Kevex Superdry EDS & Digital Imaging
SEM/EDS: Scanning Electron Microscope with Energy Dispersive Spectrometry
* Schottky Field Emission Gun gives >3nm Resolution
* 150mm - 6 Inch - Wafer Navigation
* Sensitive to Elements down to Carbon
* Analysis Area down to 0.1mm
* Sample Accommodates 150 mm - 6 Inch - Wafers and Smaller Samples
* Wafer Inspection or a Laboratory SEM
* Failure Analysis: Cross-Section and Plan-View Examination
* Compositional Microanalysis and Mapping
* Devices from Data Storage, MEMS, Semiconductor and Related
