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> Skyray spectrometer portable benchtop EDX660P xrf used*
Skyray spectrometer portable benchtop EDX660P xrf used*
Skyray Spectrometer Portable Benchtop EDX660P XRF Used*
Measurable Elements: Au Ag Cu Zn Ni Pd Pt Rh Cd Ru (Metals)
Measurable Substance: Solid, Liquid, Powder
Content ratio Range: 0.1%-99.99%
Measurement time: 60-300 seconds
Coating thickness precision: 0.01~0.05 mm
Detector: Proportional counter, Si-PIN available
Tested in House and does turn on
Condition: Used, Cosmetic damage on case and a little bit of bent metal where the USB cables come out of (see pictures for details)
The Spectrometer pictured below
